A Study of EMI-TFSI Using Current Sensing Atomic Force Microscopy
No Thumbnail Available
Authors
Meeting name
Sponsors
Date
Journal Title
Format
Thesis
Subject
Abstract
A current sensing atomic force microscope was employed to find simultaneous force-distance and current-distance curves for the ionic liquid EMI TFSI on HOPG. These current curves, found at various voltage biases were converted to find conductance- distance curves. The conductance curves were analyzed to see the cantilever, HOPG surface and ions in EMI TFSI act with a capacitor like behavior. Calculations for the capacitance and energy stored are included. Derivations for the jump off force for a tip, sample system in a liquid environment with potential difference have been performed. These formulas for the jump off forces have been evaluated and compared with the experimental jump off forces.
Table of Contents
Introduction -- Equipment -- Results -- Discussion
DOI
PubMed ID
Degree
M.S.