Browsing by Title "Atomic force microscopy measurements of topography and friction on dotriacontane films absorbed on a SiO2 surface [abstract]"
Now showing items 1-1 of 1
-
Atomic force microscopy measurements of topography and friction on dotriacontane films absorbed on a SiO2 surface [abstract]
(University of Missouri--Columbia. Office of Undergraduate Research, 2005)We report comprehensive atomic force microscopy (AFM) measurements of the nanoscale topography and lateral friction on the surface of thin films of an intermediate-length normal alkane, dotriacontane, at room temperature. ...