Using current sensing atomic force microscopy to study heterogeneous materials

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Using current sensing atomic force microscopy to study heterogeneous materials

Please use this identifier to cite or link to this item: http://hdl.handle.net/10355/14950

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Title: Using current sensing atomic force microscopy to study heterogeneous materials
Author: Liu, Yucong
Date: 2012-08-27
Publisher: University of Missouri--Kansas City
Abstract: Two kinds of heterogeneous materials, block copolymer films and Nafion membranes, are studied by using current sensing atomic force microscopy (CSAFM). In the calculated results, correlation between surface morphology and surface conductance images is obtained using CSAFM, and the implication of the surface conductance and its variations is analyzed. It is found that if the diameter of the CSAFM probe tip is much smaller than the correlation length of the surface morphological features, the current sensing image obtained using the probe has little correlation with the surface morphology, and the current sensed by CSAFM indeed reflects the variation of local resistivity on the sample surface. In experimental results, the microphase separation of block copolymer and the current passing through the ion channel in Nafion membranes are observed by CSAFM. This demonstrates that CSAFM is a powerful and important tool for studying heterogeneous materials.
URI: http://hdl.handle.net/10355/14950

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