Using current sensing atomic force microscopy to study heterogeneous materials

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Using current sensing atomic force microscopy to study heterogeneous materials

Please use this identifier to cite or link to this item: http://hdl.handle.net/10355/14950

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dc.contributor.advisor Zhu, Da-Ming en
dc.contributor.author Liu, Yucong
dc.date.accessioned 2012-08-27T15:34:18Z
dc.date.available 2012-08-27T15:34:18Z
dc.date.issued 2012-08-27
dc.date.submitted 2012 Summer en
dc.identifier.uri http://hdl.handle.net/10355/14950
dc.description Title from PDF of title page, viewed on August 27, 2012 en
dc.description Thesis advisor: Da-Ming Zhu en
dc.description Vita en
dc.description Includes bibliographic references (p. 73-74) en
dc.description Thesis (M.S.)--Dept. of Physics. University of Missouri--Kansas City, 2012 en
dc.description.abstract Two kinds of heterogeneous materials, block copolymer films and Nafion membranes, are studied by using current sensing atomic force microscopy (CSAFM). In the calculated results, correlation between surface morphology and surface conductance images is obtained using CSAFM, and the implication of the surface conductance and its variations is analyzed. It is found that if the diameter of the CSAFM probe tip is much smaller than the correlation length of the surface morphological features, the current sensing image obtained using the probe has little correlation with the surface morphology, and the current sensed by CSAFM indeed reflects the variation of local resistivity on the sample surface. In experimental results, the microphase separation of block copolymer and the current passing through the ion channel in Nafion membranes are observed by CSAFM. This demonstrates that CSAFM is a powerful and important tool for studying heterogeneous materials. en_US
dc.description.tableofcontents Introduction -- Experimental set-up -- Results and discussion en
dc.format.extent xiii, 75 pages en
dc.language.iso en_US en_US
dc.publisher University of Missouri--Kansas City en
dc.subject.lcsh Block copolymers en
dc.subject.lcsh Fluoropolymers en
dc.subject.lcsh Atomic force microscopy en
dc.subject.lcsh Inhomogeneous materials en
dc.subject.other Thesis -- University of Missouri--Kansas City -- Physics en
dc.title Using current sensing atomic force microscopy to study heterogeneous materials en_US
dc.type Thesis en_US
thesis.degree.discipline Physics en
thesis.degree.grantor University of Missouri--Kansas City en
thesis.degree.name M.S. en
thesis.degree.level Masters en


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