dc.contributor.advisor | Winholtz, Robert Andrew, 1961- | eng |
dc.contributor.author | Rodrigues, Prajval Stephen | eng |
dc.date.issued | 2005 | eng |
dc.date.submitted | 2005 Fall | eng |
dc.description | The entire dissertation/thesis text is included in the research.pdf file; the official abstract appears in the short.pdf file (which also appears in the research.pdf); a non-technical general description, or public abstract, appears in the public.pdf file. | eng |
dc.description | Title from title screen of research.pdf file viewed on (December 18, 2006) | eng |
dc.description | Includes bibliographical references. | eng |
dc.description | Thesis (M.S.) University of Missouri-Columbia 2005. | eng |
dc.description | Dissertations, Academic -- University of Missouri--Columbia -- Mechanical and aerospace engineering. | eng |
dc.description.abstract | There is currently much interest in femtosecond scale laser interactions with materials. Comparison of the damage produced by the femtosecond laser pulses to the longer laser pulses is also of interest. This study examined the use of X-ray topography to investigate the effects and differences in laser irradiation damage to single crystal silicon. X-ray topography provides a unique method of examining the damage produced. Silicon wafer specimens were prepared with laser irradiated spots at different fluence levels with both nanosecond pulsed and femtosecond pulsed lasers. High-resolution X-ray topographs of the laser-irradiated spots on both groups of crystals were produced. The topographs were compared with the optical micrographs for feature size analysis. Damage within the irradiated region was characterized with rocking curve analysis. Analysis was also done to compare damage in the different (hkl) planes and for differentiating the type of damage done by nanosecond and femtosecond lasers. | eng |
dc.identifier.merlin | b57454553 | eng |
dc.identifier.uri | http://hdl.handle.net/10355/4248 | |
dc.language | English | eng |
dc.publisher | University of Missouri--Columbia | eng |
dc.relation.ispartofcommunity | University of Missouri--Columbia. Graduate School. Theses and Dissertations | eng |
dc.subject | X-ray topography. | eng |
dc.subject | X-ray topography | eng |
dc.subject.lcsh | Femtochemistry | eng |
dc.subject.lcsh | Silicon | eng |
dc.subject.lcsh | X-ray spectroscopy | eng |
dc.title | X-ray topography techniques for the analysis of laser irradiated silicon | eng |
dc.type | Thesis | eng |
thesis.degree.discipline | Mechanical and aerospace engineering (MU) | eng |
thesis.degree.grantor | University of Missouri--Columbia | eng |
thesis.degree.level | Masters | eng |
thesis.degree.name | M.S. | eng |