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dc.contributor.advisorViator, John A.eng
dc.contributor.authorGoldschmidt, Benjamin S.eng
dc.date.issued2014eng
dc.date.submitted2014 Springeng
dc.description"May 2014."eng
dc.descriptionDissertation Supervisor: Dr. John A. Viator.eng
dc.descriptionIncludes vita.eng
dc.description.abstractIn recent years, major research funding and commercial development has been going toward the production and characterization of increasingly useful nanomaterials. These materials such as quantum dots, nanoparticles, and thin films can increase the efficiency of solar panels, create new treatments for cancer, and vastly improve the detection capabilities for various optical sensors for biosensing. Unfortunately, to date, very few methods of characterizing these types of materials exist such as scanning electron microscopy and ellipsometry. These techniques are prohibitively expensive, cannot be used with all materials, and require rigorous preparation schemes before scanning. Therefore, a new method to characterize thin films and detect the properties of nanomaterials is needed. This study proposes a newly revived method, Total Internal Reflection Photoacoustic Spectroscopy, along with related techniques, to deliver cost effective characterization and detection for nanomaterials and thin films.eng
dc.description.bibrefIncludes bibliographical references (pages 122-143).eng
dc.format.extent1 online resource (3 files) : illustrations (some color)eng
dc.identifier.merlinb107802508eng
dc.identifier.oclc905907158eng
dc.identifier.urihttps://hdl.handle.net/10355/44173
dc.identifier.urihttps://doi.org/10.32469/10355/44173eng
dc.languageEnglisheng
dc.publisher[University of Missouri--Columbia]eng
dc.relation.ispartofcommunityUniversity of Missouri--Columbia. Graduate School. Theses and Dissertationseng
dc.rightsOpenAccesseng
dc.rights.licenseThis work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivs 3.0 License.
dc.sourceSubmitted by the University of Missouri--Columbia Graduate Schooleng
dc.subjectAuthor supplied: evanescent field; photoacoustic; nanomaterials; TIRPAS; acoustic; lasereng
dc.titlePhotoacoustic evaluation of surfaces via pulsed evanescent field interactioneng
dc.typeThesiseng
thesis.degree.disciplineBiological engineering (MU)eng
thesis.degree.grantorUniversity of Missouri--Columbiaeng
thesis.degree.levelDoctoraleng
thesis.degree.namePh. D.eng


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