• Temperature dependence of surface roughening during homoepitaxial growth on Cu(001) 

    Botez, Christian E. (Christian Emil) 1968-; Miceli, Paul F.; Stephens, P. W. (American Physical Society, 2001)
    X-ray scattering has been used to study the roughening of the Cu(001) surface during homoepitaxial growth, as a function of temperature. Between 370 and 160 K, the mean-square roughness σ2, obtained from specular reflectivity ...