Annealing-Dependent Magnetic Depth Profile in Ga[1-x]Mn[x]As

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Annealing-Dependent Magnetic Depth Profile in Ga[1-x]Mn[x]As

Please use this identifier to cite or link to this item: http://hdl.handle.net/10355/5208

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Title: Annealing-Dependent Magnetic Depth Profile in Ga[1-x]Mn[x]As
Author: Kirby, Brian J., 1977-
Keywords: annealing processes
magnetization
Date: 2004-01-04
Publisher: American Physical Society
Citation: PHYSICAL REVIEW B 69, 081307~R! ~2004!
Abstract: We have studied the depth-dependent magnetic and structural properties of as-grown and optimally annealed Ga[1-x]Mn[x]As films using polarized neutron reflectometry. In addition to increasing total magnetization, the annealing process was observed to produce a significantly more homogeneous distribution of the magnetization. This difference in the films is attributed to the redistribution of Mn at interstitial sites during the annealing process. Also, we have seen evidence of significant magnetization depletion at the surface of both as-grown and annealed films.
URI: http://hdl.handle.net/10355/5208
ISSN: 1550-235X

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