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dc.contributor.authorKirby, Brian J., 1977-eng
dc.date.issued2004eng
dc.description.abstractWe have studied the depth-dependent magnetic and structural properties of as-grown and optimally annealed Ga[1-x]Mn[x]As films using polarized neutron reflectometry. In addition to increasing total magnetization, the annealing process was observed to produce a significantly more homogeneous distribution of the magnetization. This difference in the films is attributed to the redistribution of Mn at interstitial sites during the annealing process. Also, we have seen evidence of significant magnetization depletion at the surface of both as-grown and annealed films.eng
dc.description.sponsorshipThe contribution to this work from Missouri and Notre Dame was supported by NSF Grant No. DMR-013819. Work at Argonne was supported by U.S. DOE, Office of Science Contract No. W-31-109-ENG-38.eng
dc.identifier.citationPHYSICAL REVIEW B 69, 081307~R! ~2004!eng
dc.identifier.issn1550-235Xeng
dc.identifier.urihttp://hdl.handle.net/10355/5208eng
dc.languageEnglisheng
dc.publisherAmerican Physical Societyeng
dc.relation.ispartofcollectionUniversity of Missouri--Columbia. College of Arts and Sciences. Department of Physics and Astronomy. Physics and Astronomy publicationseng
dc.source.urihttp://prb.aps.org/pdf/PRB/v69/i8/e081307eng
dc.subjectannealing processeseng
dc.subjectmagnetizationeng
dc.titleAnnealing-Dependent Magnetic Depth Profile in Ga[1-x]Mn[x]Aseng
dc.typeArticleeng


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