A Study of EMI-TFSI Using Current Sensing Atomic Force Microscopy

Abstract

A current sensing atomic force microscope was employed to find simultaneous force-distance and current-distance curves for the ionic liquid EMI TFSI on HOPG. These current curves, found at various voltage biases were converted to find conductance- distance curves. The conductance curves were analyzed to see the cantilever, HOPG surface and ions in EMI TFSI act with a capacitor like behavior. Calculations for the capacitance and energy stored are included. Derivations for the jump off force for a tip, sample system in a liquid environment with potential difference have been performed. These formulas for the jump off forces have been evaluated and compared with the experimental jump off forces.