Shared more. Cited more. Safe forever.
    • advanced search
    • submit works
    • about
    • help
    • contact us
    • login
    View Item 
    •   MOspace Home
    • University of Missouri-Columbia
    • Office of Undergraduate Research (MU)
    • Undergraduate Research and Creative Achievements Forum (MU)
    • 2004 Undergraduate Research and Creative Achievements Forum (MU)
    • View Item
    •   MOspace Home
    • University of Missouri-Columbia
    • Office of Undergraduate Research (MU)
    • Undergraduate Research and Creative Achievements Forum (MU)
    • 2004 Undergraduate Research and Creative Achievements Forum (MU)
    • View Item
    JavaScript is disabled for your browser. Some features of this site may not work without it.
    advanced searchsubmit worksabouthelpcontact us

    Browse

    All of MOspaceCommunities & CollectionsDate IssuedAuthor/ContributorTitleIdentifierThesis DepartmentThesis AdvisorThesis SemesterThis CollectionDate IssuedAuthor/ContributorTitleIdentifierThesis DepartmentThesis AdvisorThesis Semester

    Statistics

    Most Popular ItemsStatistics by CountryMost Popular AuthorsStatistics by Referrer

    Atomic force microscopy measurements of topography in dotriacontane films adsorbed on SiO2 [abstract]

    Simpson, Matthew
    View/Open
    [PDF] Atomic force microscopy.pdf (27.33Kb)
    Date
    2004
    Contributor
    University of Missouri-Columbia. Office of Undergraduate Research
    Format
    Abstract
    Metadata
    [+] Show full item record
    Abstract
    Thin films of alkane molecules (chemical formula CnH2n+2) are of particular research interest in studies of lubrication on the microscopic level. On one hand, alkane molecules serve as a simpler model for more complex polymers used in coatings, adhesives and electronic devices. On the other hand, alkane molecules are the primary constituents of commercial lubricants. Knowledge of the structure of a thin film of alkane molecules could lead to a better understanding of lubrication on the microscopic level. In our study, we have selected to study the alkane molecule dotriacontane (chemical formula C32H66). We have chosen to use the technique of Atomic Force Microscopy (AFM) to study our dotriacontane films. AFM is a technique that was developed in 1986 which is able to determine the topography of films on a nano-scale, in particular our dotriacontane films. AFM utilizes a sharp tip that slides across the surface of our film, detecting the various small changes in height. Using this technique, we can determine the structure of dotriacontane films deposited from a heptane solution onto SiO2 coated wafers. We find evidence that there are 1 to 2 layers of molecules with their long-axis parallel to the plane of the surface, followed by a single layer of molecules with their long-axis perpendicular to the plane of surface. In addition, we have evidence of islands consisting of more than one perpendicular layer.
    URI
    http://hdl.handle.net/10355/700
    Part of
    2004 Undergraduate Research and Creative Achievements Forum (MU)
    Collections
    • 2004 Undergraduate Research and Creative Achievements Forum (MU)

    Send Feedback
    hosted by University of Missouri Library Systems
     

     


    Send Feedback
    hosted by University of Missouri Library Systems