Browsing University of Missouri Research Reactor Center (MU) by Title "High-resolution ellipsometric study of an n-alkane film, dotriacontane, adsorbed on a SiO2 surface"
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High-resolution ellipsometric study of an n-alkane film, dotriacontane, adsorbed on a SiO2 surface
(American Institute of Physics, 2002)Using high-resolution ellipsometry and stray light intensity measurements, we have investigated during successive heating-cooling cycles the optical thickness and surface roughness of thin dotriacontane (n-C32H66) films ...