Browsing University of Missouri Research Reactor Center (MU) by Title "Nanoscale observation of delayering in alkane films"
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Nanoscale observation of delayering in alkane films
(Institute of Physics, 2007)Tapping-mode Atomic Force Microscopy and synchrotron X-ray scattering measurements on dotriacontane (n-C32H66 or C32) films adsorbed on SiO2-coated Si(100) wafers reveal a narrow temperature range near the bulk C32 melting ...