dc.contributor.author | Kangarlu, Allahyar, 1956- | eng |
dc.contributor.author | Chandrasekhar, Holalkere R. | eng |
dc.contributor.author | Chandrasekhar, Meera | eng |
dc.contributor.author | Kapoor, Yogendra Mohan | eng |
dc.contributor.author | Chambers, F. A. | eng |
dc.contributor.author | Vojak, B. A. | eng |
dc.contributor.author | Meese, J. M. | eng |
dc.date.issued | 1988 | eng |
dc.description | URL:http://link.aps.org/doi/10.1103/PhysRevB.38.9790
DOI:10.1103/PhysRevB.38.9790 | eng |
dc.description.abstract | A detailed photoreflectance study of a GaAs-Al0.3Ga0.7As multiple quantum well of well width 260 Å is carried out at 300 and 80 K. The pressure dependence of a large number of quantized states is observed. The sublinearity of pressure dependence increases with increasing quantum number. A model calculation that includes the pressure dependence of electron effective mass accurately describes the data. Transitions associated with L and X band extrema are observed and their pressure coefficients deduced. | eng |
dc.description.sponsorship | This work was supported by the U.S. Department of Energy under Contract No. DE-AC02-84ER45048 and by the U.S. Army under Contract No. DAAL03-86-K0083. | eng |
dc.identifier.citation | Phys. Rev. B 38, 9790-9796 (1988) | eng |
dc.identifier.issn | 1098-0121 | eng |
dc.identifier.uri | http://hdl.handle.net/10355/8171 | eng |
dc.language | English | eng |
dc.publisher | American Physical Society | eng |
dc.relation.ispartofcollection | University of Missouri--Columbia. College of Arts and Sciences. Department of Physics and Astronomy. Physics and Astronomy publications | eng |
dc.source | Harvested from: American Physical Society | eng |
dc.subject | III-V semiconductors | eng |
dc.subject | piezo-, elasto-, and acoustooptical effects | eng |
dc.subject.lcsh | Semiconductors | eng |
dc.subject.lcsh | Acoustooptics | eng |
dc.title | High-pressure studies of GaAs-AlxGa1-xAs quantum wells at 300 and 80 K using photoreflectance spectroscopy | eng |
dc.type | Article | eng |