Nanoscale observation of delayering in alkane films

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Nanoscale observation of delayering in alkane films

Please use this identifier to cite or link to this item: http://hdl.handle.net/10355/8710

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Title: Nanoscale observation of delayering in alkane films
Author: Bai, Mengjun; Knorr, K.; Simpson, M. J.; Trogisch, S.; Taub, Haskell; Ehrlich, S. N.; Mo, Haiding, 1969-; Volkmann, Ulrich G.; Hansen, Flemming Y.
Date: 2007-07-03
Publisher: Institute of Physics
Citation: M. Bai et al 2007 EPL 79 26003
Abstract: Tapping-mode Atomic Force Microscopy and synchrotron X-ray scattering measurements on dotriacontane (n-C32H66 or C32) films adsorbed on SiO2-coated Si(100) wafers reveal a narrow temperature range near the bulk C32 melting point Tb in which a monolayer phase of C32 molecules oriented perpendicular to surface is stable. This monolayer phase undergoes a delayering transition to a three-dimensional (3D) fluid phase on heating to just above Tb and to a solid 3D phase on cooling below Tb. An equilibrium phase diagram provides a useful framework for interpreting the unusual spreading and receding of the monolayer observed in transitions to and from the respective 3D phases.
URI: http://hdl.handle.net/10355/8710
ISSN: 0295-5075

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