Nanoscale observation of delayering in alkane films
Simpson, M. J.
Ehrlich, S. N.
Mo, Haiding, 1969-
Volkmann, Ulrich G.
Hansen, Flemming Y.
Metadata[+] Show full item record
Tapping-mode Atomic Force Microscopy and synchrotron X-ray scattering measurements on dotriacontane (n-C32H66 or C32) films adsorbed on SiO2-coated Si(100) wafers reveal a narrow temperature range near the bulk C32 melting point Tb in which a monolayer phase of C32 molecules oriented perpendicular to surface is stable. This monolayer phase undergoes a delayering transition to a three-dimensional (3D) fluid phase on heating to just above Tb and to a solid 3D phase on cooling below Tb. An equilibrium phase diagram provides a useful framework for interpreting the unusual spreading and receding of the monolayer observed in transitions to and from the respective 3D phases.
Missouri Research Reactor publications (MU)
M. Bai et al 2007 EPL 79 26003