Structural perfection in physisorbed films: A synchrotron x-ray diffraction study of xenon adsorbed on the Ag(111) surface

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Structural perfection in physisorbed films: A synchrotron x-ray diffraction study of xenon adsorbed on the Ag(111) surface

Please use this identifier to cite or link to this item: http://hdl.handle.net/10355/8791

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Title: Structural perfection in physisorbed films: A synchrotron x-ray diffraction study of xenon adsorbed on the Ag(111) surface
Author: Dai, Pengcheng, 1963-; Angot, T.; Ehrlich, S. N.; Wang, S. -K.; Taub, Haskell
Date: 1994-01-31
Publisher: American Physical Society
Citation: Phys. Rev. Lett. 72, 685-688 (1994)
Abstract: Synchrotron x-ray scattering has been used to investigate the structure and growth of xenon films physisorbed on the Ag(111) surface. For growth under quasiequilibrium conditions, the bulk Xe-Xe spacing is reached at monolayer completion and fcc films of thickness ≥220 Å are observed. Under kinetic growth conditions, intensity oscillations in the specular reflectivity as a function of time demonstrate nearly layer-by-layer growth. Modeling of the intensity at a fixed coverage allows profiling of the Xe/vacuum interface as well as a direct determination of the film's thickness and layer spacings.
URI: http://hdl.handle.net/10355/8791
ISSN: 0031-9007

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