X-ray scattering from rotational disorder in epitaxial films: An unconventional mosaic crystal

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X-ray scattering from rotational disorder in epitaxial films: An unconventional mosaic crystal

Please use this identifier to cite or link to this item: http://hdl.handle.net/10355/7551

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Title: X-ray scattering from rotational disorder in epitaxial films: An unconventional mosaic crystal
Author: Miceli, Paul F.; Palmstrom, C. J.
Keywords: X-ray diffraction and scattering
structure and morphology
crystalline orientation and texture
Date: 1995-02-15
Publisher: American Physical Society
Citation: Phys. Rev. B 51, 5506-5509 (1995)
Abstract: Motivated by x-ray-scattering measurements performed on ErAs(001)/GaAs(001) and In0.7Ga0.3P(001)/GaAs(001), we present a model that explains the origin of a narrow peak and diffuse scattering, which are frequently observed at Bragg reflections in epitaxial systems. Central to the model is a correlation length for mosaiclike rotational disorder that arises in lattice-mismatched epitaxial films. The adhesive force between the film and the substrate is found to play a crucial role and leads to a striking anisotropy in the line shapes.
URI: http://hdl.handle.net/10355/7551
ISSN: 1098-0121

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