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X-ray scattering from rotational disorder in epitaxial films: An unconventional mosaic crystal
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X-ray scattering from rotational disorder in epitaxial films: An unconventional mosaic crystal
Please use this identifier to cite or link to this item: http://hdl.handle.net/10355/7551
| Title: | X-ray scattering from rotational disorder in epitaxial films: An unconventional mosaic crystal |
| Author: | Miceli, Paul F.; Palmstrom, C. J. |
| Keywords: |
X-ray diffraction and scattering
structure and morphology crystalline orientation and texture |
| Date: | 1995-02 |
| Publisher: | American Physical Society |
| Citation: | Phys. Rev. B 51, 5506-5509 (1995) |
| Abstract: | Motivated by x-ray-scattering measurements performed on ErAs(001)/GaAs(001) and In0.7Ga0.3P(001)/GaAs(001), we present a model that explains the origin of a narrow peak and diffuse scattering, which are frequently observed at Bragg reflections in epitaxial systems. Central to the model is a correlation length for mosaiclike rotational disorder that arises in lattice-mismatched epitaxial films. The adhesive force between the film and the substrate is found to play a crucial role and leads to a striking anisotropy in the line shapes. |
| URI: | http://hdl.handle.net/10355/7551 |
| ISSN: | 1098-0121 |
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Physics and Astronomy publications (MU) [549]
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