X-ray scattering from rotational disorder in epitaxial films: An unconventional mosaic crystal

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Please use this identifier to cite or link to this item: http://hdl.handle.net/10355/7551

Title:	X-ray scattering from rotational disorder in epitaxial films: An unconventional mosaic crystal
Author:	Miceli, Paul F.; Palmstrom, C. J.
Keywords:	X-ray diffraction and scattering structure and morphology crystalline orientation and texture
Date:	1995-02-15
Publisher:	American Physical Society
Citation:	Phys. Rev. B 51, 5506-5509 (1995)
Abstract:	Motivated by x-ray-scattering measurements performed on ErAs(001)/GaAs(001) and In0.7Ga0.3P(001)/GaAs(001), we present a model that explains the origin of a narrow peak and diffuse scattering, which are frequently observed at Bragg reflections in epitaxial systems. Central to the model is a correlation length for mosaiclike rotational disorder that arises in lattice-mismatched epitaxial films. The adhesive force between the film and the substrate is found to play a crucial role and leads to a striking anisotropy in the line shapes.
URI:	http://hdl.handle.net/10355/7551
ISSN:	1098-0121

Physics and Astronomy publications (MU) [549]
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