Browsing College of Engineering (MU) by Title "Characterization of porous low-k films using variable angle spectroscopic ellipsometry"
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Characterization of porous low-k films using variable angle spectroscopic ellipsometry
(American Institute of Physics, 2006)Variable angle spectroscopic ellipsometry (VASE™) is used as a tool to characterize properties such as optical constant, thickness, refractive index depth profile, and pore volume fraction of single and bilayer porous low-k ...