Vacancy formation in homoepitaxially grown Ag films and its effect on surface morphology

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Vacancy formation in homoepitaxially grown Ag films and its effect on surface morphology

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Title: Vacancy formation in homoepitaxially grown Ag films and its effect on surface morphology
Author: Botez, Christian E. (Christian Emil) 1968-; Elliot, W. C.; Miceli, Paul F.; Stephens, P. W.
Keywords: x-ray reflectometry
structure and morphology
crystalline orientation and texture
Date: 2002-08-26
Publisher: American Physical Society
Citation: Phys. Rev. B 66, 075418 (2002)
Abstract: Synchrotron x-ray diffraction was used to investigate the low-temperature homoepitaxial growth on Ag(001) and Ag(111) surfaces. For both orientations, the Ag films deposited at T=100K were observed to exhibit a 1% surface-normal compressive strain, indicating that an appreciable vacancy concentration (∼2%) is incorporated in the growing film. Concomitantly with the incorporation of vacancies, the growth on Ag(111) leads to the formation of pyramidlike structures with a non-Gaussian distribution of heights, whereas a similar effect was not observed for Ag(001).
URI: http://hdl.handle.net/10355/7469
ISSN: 1098-0121

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