Browsing College of Engineering (MU) by Identifier "0003-6951"
Now showing items 1-7 of 7
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Electric field and temperature-induced removal of moisture in nanoporous organosilicate films
(American Institute of Physics, 2004)The effects of bias-temperature-stress (BTS) or simply temperature-stress (TS) on nanoporous low-k methylsilsesquioxane films are studied. Initially, the as-given and O2 ashed/etched films exhibit physical adsorption of ... -
Erratum: “Generation of fast propagating combustion and shock waves with copper oxide/aluminum nanothermite composites” [ Appl. Phys. Lett. 91, 243109 (2007) ]
(American Institute of Physics, 2008)Another erratum concerning “Generation of fast propagating combustion and shock waves with copper oxide/aluminum nanothermite composites” [ Appl. Phys. Lett. 91, 243109 (2007) ]. -
Erratum: “Generation of fast propagating combustion and shock waves with copper oxide/aluminum nanothermite composites” [Appl. Phys. Lett. 91, 243109 (2007)]
(American Institute of Physics, 2008)Erratum concerning “Generation of fast propagating combustion and shock waves with copper oxide/aluminum nanothermite composites” [Appl. Phys. Lett. 91, 243109 (2007)]. -
Generation of fast propagating combustion and shock waves with copper oxide/aluminum nanothermite composites
(American Institute of Physics, 2007)Nanothermite composites containing metallic fuel and inorganic oxidizer are gaining importance due to their outstanding combustion characteristics. In this paper, the combustion behaviors of copper oxide/aluminum nanothermites ... -
Harvesting triplet excitons for application in polymer solar cells
(American Institute of Physics, 2009)Triplet enhanced ladder-type poly (para-phenylene) polymer (PhLPPP) with covalently bound trace amounts of palladium blended with a fullerene derivative [[6,6]-phenyl C61-butyric acid methyl ester (PCBM)] shows power ... -
Initial growth of interfacial oxide during deposition of HfO2 on silicon
(American Institute of Physics, 2004)Interfacial chemistry of Hf∕Si, HfO2∕SiO2∕Si, and HfO2∕Si is investigated by x-ray photoelectron spectroscopy in order to understand the interfacial layer formation mechanism. Deposition of Hf and HfO2 films was carried ... -
Permittivity enhancement of aluminum oxide thin films with the addition of silver nanoparticles
(American Institute of Physics, 2006)Multilayer reactive electron-beam evaporation of thin aluminum oxide layers with embedded silver nanoparticles (Ag-nps) has been used to create a dielectric thin film with an enhanced permittivity. The results show a ...